3D Atomic-Scale Metrology of Strain Relaxation And Roughness in GAAFETs Via Electron Ptychography (Cornell, ASM, TSMC)

3D Atomic-Scale Metrology of Strain Relaxation And Roughness in GAAFETs Via Electron Ptychography (Cornell, ASM, TSMC)

• Home Systems & Design Low Power - High Performance Manufacturing, Packaging & Materials Test, Measurement & Analytics Auto, Security & Enabling Technologies Special Reports Busin

Bacterial strain from 5,000-year-old cave ice shows resistance against 10 modern antibiotics

• Bacteria have evolved to adapt to all of Earth’s most extreme conditions, from scorching heat to temperatures well below zero. • Ice caves are just one of the environments hostin

Science · February 17, 2026 (updated February 24, 2026) · 1 min · 212 words