• As analog and mixed-signal designs become increasingly complex, parasitic effects dominate both design time and cost, consuming 30-50% of engineers’ effort in debugging and reanalyzing circuits. • Addressing these multiphysics effects requires early verification strategies and reliable simulation solutions. • Modern verification must extend beyond traditional RC parasitics to encompass inductance, RF interactions, voltage drop, RDS(on) effects, thermal behavior, signal integrity, photonics, and electrostatic discharge (ESD). • Synopsys recently hosted a webinar on ESD verification for full-chip and multi-die designs using its PathFinder-SC platform. • The session was presented by Peter Tsai, Product Manager; Marc Swinnen, Product Marketing Manager; and John Alwyn, Product Specialist. • It provided a detailed look at PathFinder-SC’s capabilities in addressing modern ESD verification challenges, highlighting workflows for early-stage validation, full-chip and multi-die simulation, and layout-driven debugging.
Article Summaries:
- As analog and mixed-signal designs become increasingly complex, parasitic effects dominate both design time and cost, consuming 30-50% of engineers’ effort in debugging and reanalyzing circuits. Addressing these multiphysics effects requires early verification strategies and reliable simulation solutions. Modern verification must extend beyond traditional RC parasitics to encompass inductance, RF interactions, voltage drop, RDS(on) effects, thermal behavior, signal integrity, photonics, and electrostatic discharge (ESD). Synopsys recently hosted a webinar on ESD verification for full-chip and
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